Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy

Abstract Electrostatic Force Microscopy has been proven to be a precise and versatile tool perform quantitative measurements of the dielectric constant thin film domains in nanometer range. However, it is difficult measure non-planar nanostructures because topographic crosstalk significantly contributes measured signal. This due distance changes between tip substrate measuring surface structures still an ongoing issue literature falsifies nanoparticles. Tip form capacitor based on contact potential difference material. An increase causes repulsive force while decrease attractive force. Thus, so-called lift mode scanning second scan following topography determined by first leads mirroring structure electrostatic signal superimposing from contrast. In this work we demonstrate that can avoided using linear instead mode. The use now allows determination single